CORRESPONDENCE BETWEEN LAYERED CELL STRUCTURES AND SLIP LINES IN DEFORMED COPPER SINGLE-CRYSTALS

Layered cell structures in deformed copper single crystals with the [112] and the [415] tensile axes were observed by transmission electron microscopy on slices with (¯1;¯1;1), (1¯1;0), and (001). It was confirmed that cell walls are formed on planes rotated around the <112> axis on the active slip plane to a definite direction with respect to the tensile axis. The rotation angles were measured as a function of tensile stress. The slip line lengths on the two side planes were measured by optical microscopy. The slip line lengths and the ratios of the slip line lengths of edge dislocations to those of screw dislocations agree approximately with the slip distances estimated from the spacing and the rotation angle of the cell walls, assuming that the cell walls of the primary system are obstacles for primary dislocations. It is concluded that the slip line length is mainly determined by the layered cell structure. © 1979 IOP Publishing Ltd.