Preparation of Undamaged X-Ray Orientated Surface Planes of Any Crystallographic Direction on Plastic Single Crystals

被引:5
作者
Arnold, J. -U. [1 ]
Jaumann, J. [1 ]
机构
[1] Univ Cologne, Inst Phys 2, Cologne, Germany
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1970年 / 3卷 / 01期
关键词
D O I
10.1002/pssa.19700030105
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A device for chemical polishing allows the preparation of any desired crystal plane on tellurium single crystals. The orientation of the planes is done using X-rays to an accuracy of better than 30' with a special goniometerlike sample support and a Laue chamber. By its special design this sample support allows the preparation of the previously orientated planes in the etching apparatus with the same precision. The examination of the prepared surfaces by the Barth technique [l] shows no increase of structure defects compared with naturally grown surfaces. The crowning of the planes is comparable to ground and afterwards etched samples.
引用
收藏
页码:37 / 41
页数:5
相关论文
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