ON THE PHOTODEFLECTION METHOD APPLIED TO LOW THERMAL-DIFFUSIVITY MEASUREMENTS

被引：79

作者：

BERTOLOTTI, M ^{[1
]}

VOTI, RL ^{[1
]}

LIAKHOU, G ^{[1
]}

SIBILIA, C ^{[1
]}

机构：

[1] POLYTECH INST KISHINEV,KISHINEV,MOLDOVA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1993年 / 64卷 / 06期

关键词：

D O I：

10.1063/1.1144029

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The photodeflection method when applied to measure the low thermal diffusivity of some materials gives inconsistent results. In this article a way to extend the thermal diffusivity range of measurements using the phase of the photodeflection signal is presented. A comparison with computer simulations and experimental results shows good agreement.

引用

页码：1576 / 1583

页数：8

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