LEED ANALYSIS OF THE RH(100)-(2X2)-S SURFACE-STRUCTURE

被引：24

作者：

HENGRASMEE, S ^{[1
]}

WATSON, PR ^{[1
]}

FROST, DC ^{[1
]}

MITCHELL, KAR ^{[1
]}

机构：

[1] UNIV BRITISH COLUMBIA,DEPT CHEM,VANCOUVER V6T 1W5,BC,CANADA

来源：

关键词：

D O I：

10.1016/0039-6028(79)90185-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

[No abstract available]

引用

页码：L249 / L254

页数：6

共 19 条

[1] Mitchell, Shepherd, Watson, Frost, Surface Sci., 64, (1977)
[2] Watson, Shepherd, Frost, Mitchell, Surface Sci., 72, (1978)
[3] Frost, Mitchell, Shepherd, Watson, Use of a Vidicon camera for the measurement of LEED beam intensities by the photographic method, Journal of Vacuum Science and Technology, 13, (1976)
[4] Zanazzi, Jona, Jepsen, Marcus, Phys. Rev., 14 B, (1976)
[5] Gauthier, Aberdam, Baudoing, Surface Sci., 78, (1978)
[6] Pendry, Low Energy Electron Diffraction, (1974)
[7] Moruzzi, Janak, Williams, Calculations of Electronic Properties of Metals, (1978)
[8] Shepherd, Watson, Frost, Mitchell, J. Phys., 11 C, (1978)
[9] Demuth, Jepsen, Marcus, Surface Sci., 45, (1974)
[10] Van Hove, Tong, Chemisorption bond lengths of chalcogen overlayers at a low coverage by convergent perturbation methods, Journal of Vacuum Science and Technology, 12, (1975)