CHARACTERIZATION OF SURFACE OXIDES BY RAMAN-SPECTROSCOPY

被引：58

作者：

FARROW, RL

BENNER, RE

NAGELBERG, AS

MATTERN, PL

机构：

来源：

THIN SOLID FILMS | 1980年 / 73卷 / 02期

关键词：

D O I：

10.1016/0040-6090(80)90499-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：353 / 358

页数：6

共 13 条

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[4] CHARACTERIZATION OF SURFACE OXIDES BY RAMAN-SPECTROSCOPY [J].

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MATTERN, PL ;

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APPLIED PHYSICS LETTERS, 1980, 36 (03) :212-214

[5] RAMAN-SPECTROSCOPY OF SURFACE OXIDES AT ELEVATED-TEMPERATURES [J].

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[6]

GIGGINS CS, 1969, T METALL SOC AIME, V245, P2495

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JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1977, 84 (01) :1-20

[8] COMPARISON OF CRYSTAL FIELDS AND OPTICAL SPECTRA OF CR2O3 AND RUBY [J].

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[9]

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[10] RAMAN-SPECTRA OF POSSIBLE CORROSION PRODUCTS OF IRON [J].

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