SYSTEMATIC ELECTRON-DIFFRACTION BY HCP METALS .2. CRITICAL VOLTAGE EFFECT

被引：5

作者：

JONES, IP

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1978年 / 47卷 / 02期

关键词：

D O I：

10.1002/pssa.2210470208

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：385 / 395

页数：11

共 14 条

[1]

BUXTON BF, 1974, HIGH VOLTAGE ELECT M, P60

[2]

FOX AG, 1977, THESIS U BIRMINGHAM

[3]

Hewat E. A., 1974, HIGH VOLTAGE ELECTRO, P52

[4]

HIRSCH PB, 1965, ELECTRON MICROSCOPY

[5]

HOWIE A, 1966, PHIL MAG, V14, P225

[6] SYSTEMATIC ELECTRON-DIFFRACTION BY HCP METALS .1. THEORY AND MAIN BEAM TRANSMISSION [J].

JONES, IP .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1978, 47 (01) :163-178

[7]

JONES IP, 1972, 5 P EUR C EL MICR MA, P462

[8] HIGHER-ORDER LAUE ZONE EFFECTS IN ELECTRON-DIFFRACTION AND THEIR USE IN LATTICE-PARAMETER DETERMINATION [J].

JONES, PM ;

RACKHAM, GM ;

STEEDS, JW .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1977, 354 (1677) :197-&

[9] CRITICAL VOLTAGE EFFECT IN HIGH-VOLTAGE ELECTRON-MICROSCOPY [J].

LALLY, JS ;

HUMPHREYS, CJ ;

METHERELL, AJ ;

FISHER, RM .

PHILOSOPHICAL MAGAZINE, 1972, 25 (02) :321-+

[10] PERTURBATION-THEORY IN TRANSMISSION ELECTRON-DIFFRACTION .1. PERTURBING MATRIX IS CONSTANT AND HERMITIAN [J].

SERNEELS, R ;

GEVERS, R .

PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1972, 50 (01) :99-&

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