SIMULTANEOUS ENERGY AND ANGLE RESOLVED ION-SCATTERING SPECTROSCOPY

被引：19

作者：

ACKERMANS, PAJ

VANDERMEULEN, PFHM

OTTEVANGER, H

VANSTRATEN, FE

BRONGERSMA, HH

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1988年 / 35卷 / 3-4期

关键词：

D O I：

10.1016/0168-583X(88)90327-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：541 / 543

页数：3

共 10 条

[1] QUANTITATIVE SURFACE-STRUCTURE ANALYSIS BY LOW-ENERGY ION-SCATTERING [J].

AONO, M .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 2 (1-3) :374-383

[2] QUANTITATIVE-ANALYSIS OF 1ST AND 2ND SURFACE-LAYERS BY LEIS (TOF) [J].

BUCK, TM ;

WHEATLEY, GH ;

JACKSON, DP .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3) :257-265

[3] NOVEL CHARGED-PARTICLE ANALYZER FOR MOMENTUM DETERMINATION IN THE MULTI-CHANNELING MODE .1. DESIGN ASPECTS AND ELECTRON-ION OPTICAL-PROPERTIES [J].

ENGELHARDT, HA ;

BACK, W ;

MENZEL, D ;

LIEBL, H .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (06) :835-839

[4] NOVEL CHARGED-PARTICLE ANALYZER FOR MOMENTUM DETERMINATION IN THE MULTICHANNELING MODE .2. PHYSICAL REALIZATION, PERFORMANCE TESTS, AND SAMPLE SPECTRA [J].

ENGELHARDT, HA ;

ZARTNER, A ;

MENZEL, D .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (08) :1161-1173

[5] A SIMULTANEOUS ENERGY AND ANGLE RESOLVED ION-SCATTERING SPECTROMETER [J].

HELLINGS, GJA ;

OTTEVANGER, H ;

BOELENS, SW ;

KNIBBELER, CLCM ;

BRONGERSMA, HH .

SURFACE SCIENCE, 1985, 162 (1-3) :913-920

[6] SURFACE-STRUCTURE OF EPITAXIAL NISI2 GROWN ON SI(001) DETERMINED BY LOW-ENERGY ION-SCATTERING TECHNIQUES [J].

HUANG, JH ;

DALEY, RS ;

SHUH, DK ;

WILLIAMS, RS .

SURFACE SCIENCE, 1987, 186 (1-2) :115-137

[7] NOVEL TWO-DIMENSIONAL POSITION-SENSITIVE DETECTION SYSTEM [J].

KNIBBELER, CLCM ;

HELLINGS, GJA ;

MAASKAMP, HJ ;

OTTEVANGER, H ;

BRONGERSMA, HH .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (01) :125-126

[8] RECENT DEVELOPMENTS IN ELECTRON-ENERGY ANALYZERS [J].

LECKEY, RCG .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1987, 43 (3-4) :183-214

[9] ANGLE RESOLVED DETECTION OF CHARGED-PARTICLES WITH A NOVEL TYPE TOROIDAL ELECTROSTATIC ANALYZER [J].

SMEENK, RG ;

TROMP, RM ;

KERSTEN, HH ;

BOERBOOM, AJH ;

SARIS, FW .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 195 (03) :581-586

[10] APPARATUS FOR LOW-ENERGY ION-SCATTERING SPECTROSCOPIES - IMAGING ANGULAR-DISTRIBUTIONS AND COLLECTING ANGLE-RESOLVED ENERGY-SPECTRA [J].

YARMOFF, JA ;

WILLIAMS, RS .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (03) :433-440

← 1 →