FAR-FIELD PATTERN DETERMINATION FROM THE NEAR-FIELD AMPLITUDE ON 2 SURFACES

被引:73
作者
BUCCI, OM [1 ]
DELIA, G [1 ]
LEONE, G [1 ]
PIERRI, R [1 ]
机构
[1] UNIV SALERNO,IST INGN ELETTR,I-84081 SALERNO,ITALY
关键词
D O I
10.1109/8.102738
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The possibility of determining the far field of radiating systems by measuring only the nearfield amplitude is investigated. The main difficulties of the problem are examined in some detail and a new nearfield farfield transformation technique is developed, based on the measurement of the nearfield amplitude over two surfaces surrounding the antenna under test. The accuracy of the farfield reconstruction results to be related both to the distance between such surfaces and to some a priori information concerning the nearfield phase and/or the radiating system. The information on the radiating system allows to relax the need of any information on the nearfield phase provided that the distance between the measurement surfaces is high enough. Conversely, the knowledge of a more or less corrupted nearfield phase allows to reduce such distance without affecting the accuracy of the farfield reconstruction. Numerical examples validating the effectiveness of the developed algorithm are provided for the planar scanning case. © 1990 IEEE
引用
收藏
页码:1772 / 1779
页数:8
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