TRANSIENT LEAKAGE CURRENT IN NEMATIC LCDS

被引：14

作者：

MAXIMUS, B ^{[1
]}

COLPAERT, C ^{[1
]}

DEMEYERE, A ^{[1
]}

PAUWELS, H ^{[1
]}

PLACH, HJ ^{[1
]}

机构：

[1] E MERCK AG,DIV IND CHEM,W-6100 DARMSTADT,GERMANY

来源：

LIQUID CRYSTALS | 1993年 / 15卷 / 06期

关键词：

D O I：

10.1080/02678299308036506

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

In this paper we present the transient leakage current measurement method for nematic liquid crystal displays as a technique to obtain information on the mobility and concentration of ionic impurities. The mobility depends on the temperature according to an Arrhenius-type relation, with an activation energy of about 0.3 eV. This dependence can be explained through the variation of the LC viscosity with temperature. The transported charge has also an Arrhenius relation, with an activation energy around 0.2 eV. Additionally, the influence of both a heat treatment and UV illumination on these parameters was investigated.

引用

页码：871 / 882

页数：12

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