CALCULATION OF INFLUENCE OF INELASTIC-SCATTERING OF ELECTRONS ON ELECTRON-MICROSCOPE IMAGES OF SINGLE-CRYSTALS

被引：13

作者：

DUVAL, PH ^{[1
]}

HENRY, L ^{[1
]}

机构：

[1] UNIV PARIS 11,PHYS SOLIDES LAB,F-91405 ORSAY,FRANCE

来源：

PHILOSOPHICAL MAGAZINE | 1977年 / 35卷 / 05期

关键词：

D O I：

10.1080/14786437708232960

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1381 / 1395

页数：15

共 10 条

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[3] DUVAL P, 1972, CR ACAD SCI B PHYS, V274, P684
[4] DUVAL P, 1973, THESIS U PARIS SUD
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SWANSON, N
SIMPSON, JA
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[6] MARTON L, 1961, J PHYS SOC JAPAN SB, V2, P17
[7] MISSELL DL, 1969, J PHYS C, V2, P61
[8] Raether H., 1965, SPRINGER TRACTS MODE, V38, P84
[9] SIKUCHI PATTERNS IN HIGH-VOLTAGE ELECTRON-MICROSCOPY
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[J]. PHILOSOPHICAL MAGAZINE, 1972, 26 (06): : 1447 - &
[10] DIFFERENTIAL AND TOTAL CROSS SECTION FOR EXCITATION OF 15-EV-PLASMON LOSS IN AL BY ELECTRONS
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[J]. ZEITSCHRIFT FUR PHYSIK, 1968, 208 (04): : 313 - &