HIGH-SPEED X-RAY ANALYSIS

被引:8
作者
AYERS, GL
HUANG, TC
PARRISH, W
机构
关键词
D O I
10.1107/S0021889878013217
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:229 / 233
页数:5
相关论文
共 9 条
[1]  
BYRAM SK, 1977, ADV XRAY ANAL, V20, P529
[2]  
HUANG TC, 1975, APPL PHYS LETT, V27, P123, DOI 10.1063/1.88404
[3]  
HUANG TC, 1978, ADV XRAY ANAL, V21, P275
[4]   SIMULTANEOUS DETERMINATION OF COMPOSITION AND MASS THICKNESS OF THIN-FILMS BY QUANTITATIVE X-RAY-FLUORESCENCE ANALYSIS [J].
LAGUITTON, D ;
PARRISH, W .
ANALYTICAL CHEMISTRY, 1977, 49 (08) :1152-1156
[5]  
LAGUITTON D, 1977, ADV XRAY ANAL, V20, P515
[6]  
MANTLER M, 1977, ADV XRAY ANAL, V20, P171
[7]   ROLE OF AXIAL DIVERGENCE IN POWDER DIFFRACTOMETRY [J].
PARRISH, W .
ZEITSCHRIFT FUR KRISTALLOGRAPHIE KRISTALLGEOMETRIE KRISTALLPHYSIK KRISTALLCHEMIE, 1968, 127 (1-4) :200-&
[8]  
Parrish W., 1976, T AM CRYSTALLOGR ASS, V12, P55
[9]  
PARRISH W, 1965, XRAY ANAL PAPERS, P71