AN APPARATUS FOR MEASURING THE PIEZORESISTIVITY OF SEMICONDUCTORS

被引:7
作者
POTTER, RF
MCKEAN, WJ
机构
来源
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS | 1957年 / 59卷 / 06期
关键词
D O I
10.6028/jres.059.047
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:427 / 430
页数:4
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