GOODNESS OF FIT TESTS FOR GAMMA AND EXPONENTIAL DISTRIBUTIONS

被引：39

作者：

DAHIYA, RC

GURLAND, J

机构：

来源：

关键词：

D O I：

10.2307/1267306

中图分类号：

O21 [概率论与数理统计]; C8 [统计学];

学科分类号：

020208 ; 070103 ; 0714 ;

摘要：

引用

页码：791 / &

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GURLAND J, 1962, ANN MATH STAT, V33, P813, DOI 10.1214/aoms/1177704605

[5]

Gurland J., 1956, SANKHYA, V17, P37

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[8] THEORETICAL EXPLANATION OF OBSERVED DECREASING FAILURE RATE [J].

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