DETERMINATION OF THE HEIGHT-HEIGHT CORRELATION-FUNCTION OF ROUGH SURFACES FROM DIFFUSE-X-RAY SCATTERING

被引：95

作者：

SALDITT, T ^{[1
]}

METZGER, TH ^{[1
]}

PEISL, J ^{[1
]}

REINKER, B ^{[1
]}

MOSKE, M ^{[1
]}

SAMWER, K ^{[1
]}

机构：

[1] UNIV AUGSBURG,INST PHYS,D-86135 AUGSBURG,GERMANY

来源：

EUROPHYSICS LETTERS | 1995年 / 32卷 / 04期

关键词：

D O I：

10.1209/0295-5075/32/4/008

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We show that the height-height correlation function of a rough surface can be determined from the diffuse X-ray scattering intensity by an explicit back-transformation without any model assumptions. This is in contrast to the conventional fitting procedure of the data with parameterized correlation functions. The method is illustrated by the example of an amorphous Zr-35 Co-65 film evaporated on a silicon substrate with native oxide. The height-height correlation function obtained from the diffuse-scattering data is compared to the result of in situ STM measurements.

引用

页码：331 / 336

页数：6

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