APPLICATIONS OF X-RAY DIFFRACTION TOPOGRAPHY TO STUDY OF MAGNETIC DOMAINS

被引:16
作者
POLCAROVA, M
机构
[1] Institute of Physics, Praha, Czechoslovakia
关键词
D O I
10.1109/TMAG.1969.1066479
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
X-ray diffraction topographic methods, namely, Lang's transmission topography, are briefly described. Besides different lattice defects, magnetic domains can be made visible by these methods. A number of experiments illustrating the main features of the contrast produced on domain walls are shown. The condition of visibility of 900 walls was found and interpreted on the basis of the magnetostrictive deformation of the crystal. Details of the contrast were explained using the dynamical theory of X-ray diffraction. Applications of X-ray topography to the study of magnetic domains are suggested, namely, the investigation of internal domain structures in nontransparent samples, the study of the fine structure of the walls inside the specimen, the examination of stress fields around domain walls, and the observation of domain interaction with other lattice defects. © 1969, IEEE. All rights reserved.
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页码:536 / +
页数:1
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