SMALL-ANGLE X-RAY-SCATTERING FROM THE SURFACES OF REVERSED-PHASE SILICAS - POWER-LAW SCATTERING EXPONENTS OF MAGNITUDES GREATER-THAN-4

The small-angle x-ray scattering from fully and partially derivatized porous silicas has been studied. Power-law-scattering exponents of magnitude greater than 4 have been found in all cases. The magnitudes of the exponents increased with the alkyl chain length and with the degree of surface derivatization. In a preliminary model to explain these observations, a power-law-scattering exponent with magnitude greater than 4 is related to a "fuzzy" pore boundary, in which the density varies continuously at the pore boundary instead of changing discontinuously from a value of zero in the empty pore to the essentially constant density characteristic of the bulk silica, as is usually assumed in analyses of the small-angle scattering from porous silicas.