HOT-CARRIER TRANSPORT IN P-GAAS

被引:5
作者
FURUTA, T
TANIYAMA, H
TOMIZAWA, M
YOSHII, A
机构
[1] NTT LSI Labs., Kanagawa
关键词
D O I
10.1088/0268-1242/7/3B/089
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Minority-electron transport properties in p-GaAs have been investigated using time-of-flight (TOF) and time-integrated/time-resolved photoluminescence (PL) measurements. It was found that with an increase in hole concentration the drift velocity decreases, a thermal non-equilibrium energy state exists between electrons and holes, and the energy relaxation time decreases. By combining these experimental data with a Monte Carlo calculation the scattering mechanisms in highly doped semiconductors were clarified. It was also found that energy and momentum transfers during the electron-hole interaction play an important role in the minority-electron transport for p-GaAs. This investigation revealed that the combination of an experimental approach using optical techniques, such as TOF or PL, with a theoretical approach such as a Monte Carlo calculation is indispensable in clarifying hot-carrier transport.
引用
收藏
页码:B346 / B350
页数:5
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