MAGNETIC FIELD MEASUREMENTS IN SCANNING ELECTRON MICROSCOPE

被引：24

作者：

THORNLEY, RF

HUTCHINS.JD

机构：

[1] IBM

来源：

APPLIED PHYSICS LETTERS | 1968年 / 13卷 / 08期

关键词：

D O I：

10.1063/1.1652595

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The scanning electron microscope has been used to obtain quantitative values for the fields and field gradients emerging from magnetic heads or tapes. The microscope is used to image a known reference detail adjacent to the field source and the fields are computed from the resultant pattern distortion. Gradients are obtained by measuring the resultant astigmatism of the scanning beam. Fields down to 10 Oe were measured from a tape recorded at 100 cycles/cm. © 1968 The American Institute of Physics.

引用

页码：249 / &