DETERMINATION OF STRUCTURE FACTORS BY MEANS OF INTENSITY MEASUREMENTS FROM LARGE SINGLE CRYSTALS

被引：3

作者：

BATTERMAN, BW

STROCK, H

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY | 1969年 / A 25卷

关键词：

D O I：

10.1107/S0567739469000167

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

[No abstract available]

引用

页码：109 / +

页数：1

共 13 条

[1] PENDELLOSUNG MEASUREMENT OF ATOMIC SCATTERING FACTOR OF GERMANIUM [J].

BATTERMA.BW ;

PATEL, JR .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) :1882-&

[2] EFFECT OF LONG WAVELENGTH HARMONICS ON DOUBLE CRYSTAL DIFFRACTOMETER MEASUREMENTS [J].

BATTERMAN, B .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (04) :393-&

[3] EFFECT OF THERMAL VIBRATIONS ON DIFFRACTION FROM PERFECT CRYSTALS .2. BRAGG CASE OF REFLECTION [J].

BATTERMAN, BW .

PHYSICAL REVIEW, 1962, 127 (03) :686-&

[4]

BATTERMAN BW, 1964, PHYS REV A-GEN PHYS, V134, P1354

[5] EFFECT OF THERMAL VIBRATIONS ON DIFFRACTION FROM PERFECT CRYSTALS .1. CASE OF ANOMALOUS TRANSMISSION [J].

BATTERMAN, BW .

PHYSICAL REVIEW, 1962, 126 (04) :1461-&

[6] CONTRIBUTION OF THERMAL DIFFUSE SCATTERING TO INTERGRATED BRAGG REFLECTIONS FROM PERFECT CRYSTALS [J].

CHIPMAN, DR ;

BATTERMAN, BW .

JOURNAL OF APPLIED PHYSICS, 1963, 34 (04) :912-&

[7] ABSOLUTE X-RAY SCATTERING FACTORS OF SILICON AND GERMANIUM [J].

DEMARCO, JJ ;

WEISS, RJ .

PHYSICAL REVIEW, 1965, 137 (6A) :1869-&

[8] INTENSITY OF X-RAY REFLEXION FROM PERFECT AND MOSAIC ABSORBING CRYSTALS [J].

HIRSCH, PB ;

RAMACHANDRAN, GN .

ACTA CRYSTALLOGRAPHICA, 1950, 3 (03) :187-194

[9]

JENNINGS LD, 1964, PHYS REV, V135, P1612

[10] TEMPERATURE DEPENDENCE OF X-RAY ABSORPTION BY CRYSTALS .I. PHOTO-ELECTRIC ABSORPTION [J].

OHTSUKI, YH .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1964, 19 (12) :2285-&

← 1 2 →