DISPLACEMENT MEASUREMENT FROM DOUBLE-EXPOSURE LASER PHOTOGRAPHS

被引：281

作者：

ARCHBOLD, E

ENNOS, AE

机构：

来源：

OPTICA ACTA | 1972年 / 19卷 / 04期

关键词：

D O I：

10.1080/713818559

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：253 / &

共 8 条

[1] RECORDING OF IN-PLANE SURFACE DISPLACEMENT BY DOUBLE-EXPOSURE SPECKLE PHOTOGRAPHY
ARCHBOLD, E
BURCH, JM
ENNOS, AE
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[2] PRODUCTION OF MULTIPLE BEAM FRINGES FROM PHOTOGRAPHIC SCATTERERS
BURCH, JM
TOKARSKI, JM
[J]. OPTICA ACTA, 1968, 15 (02): : 101 - &
[3] LASER SPECKLE AND ITS ELIMINATION
GABOR, D
[J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1970, 14 (05) : 509 - &
[4] INTERFEROMETRIC DISPLACEMENT MEASUREMENT ON SCATTERING SURFACES UTILIZING SPECKLE EFFECT
LEENDERTZ, JA
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1970, 3 (03): : 214 - +
[5] MASSEY GA, 1968, CR985 NASA CONTR REP
[6] STETSON KA, 1970, ENGINEERING USES HOL, P307
[7] TIZIANI HJ, 1971, OPTICA ACTA, V18, P981
[8] FORMATION AND LOCALIZATION OF HOLOGRAPHICALLY PRODUCED INTERFERENCE FRINGES
TSURUTA, T
SHIOTAKE, N
ITOH, Y
[J]. OPTICA ACTA, 1969, 16 (06): : 723 - &