OBSERVATION OF GRAIN-BOUNDARY MIGRATION USING FIELD-ION MICROSCOPY

被引：2

作者：

EATON, HC ^{[1
]}

BAYUZICK, RJ ^{[1
]}

机构：

[1] VANDERBILT UNIV,DEPT MAT SCI,NASHVILLE,TN 37235

来源：

关键词：

D O I：

10.1063/1.90303

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：115 / 117

页数：3

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