DESIGN OF A PROCESS-CONTROL SCHEME FOR DEFECTS PER 100 UNITS BASED ON AOQL

被引:1
作者
LEAVENWORTH, RS
SCHEAFFER, RL
机构
关键词
Compendex;
D O I
10.1002/nav.3800260309
中图分类号
C93 [管理学]; O22 [运筹学];
学科分类号
070105 ; 12 ; 1201 ; 1202 ; 120202 ;
摘要
A process control scheme is developed in which decisions as to the frequency of sampling are made based upon the choice of an Average Outgoing Quality Limit. The scheme utilizes plotted points on a U-control chart for defects and the theory of runs to determine when to switch among Reduced. Normal, Tightened, and 100 percent inspection. The scheme is formulated as a semi-Markov process to derive steady state equations for the probabilities of being in Reduce, Normal, Tightened, or 100 percent inspection and for Average Outgoing Quality and Average Fraction Inspected. The resulting system and the computer programs used to derive it are discussed.
引用
收藏
页码:463 / 485
页数:23
相关论文
共 9 条
[1]  
[Anonymous], 1963, MILSTD105D
[2]  
Dodge H, 1959, SAMPLING INSPECTION
[3]  
DUNCAN AJ, 1956, J AM STATISTICAL ASS, V51
[4]  
FREUND RA, 1957, IND QUALITY CONT OCT
[5]  
GRANT EL, 1972, STATISTICAL QUALITY
[6]  
HILL ID, 1962, J R STAT SOC SER A-G, V125, P31, DOI 10.2307/2343210
[7]  
MONTGOMERY DC, 1975, MANAGEMENT SCI, V21
[8]  
PYKE R, 1964, ANN MATH STATISTICS, P1746
[9]  
STEPHENS KS, 1957, IND QUALITY CONT JAN