REFLECTION X-RAY TOPOGRAPHY OF HARDNESS INDENTATIONS IN COPPER SINGLE-CRYSTALS

被引：9

作者：

YOO, KC

ROESSLER, B

ARMSTRONG, RW

KURIYAMA, M

机构：

[1] NBS,WASHINGTON,DC 20234

[2] UNIV MARYLAND,COLLEGE PK,MD 20742

来源：

SCRIPTA METALLURGICA | 1981年 / 15卷 / 11期

关键词：

D O I：

10.1016/0036-9748(81)90308-2

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：1245 / 1250

页数：6

共 14 条

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WU, CC .

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[3] APPLICATION OF CONTRAST CONDITIONS TO DYNAMICAL IMAGES OF IMMOBILE DISLOCATIONS [J].

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[4] ASYMMETRIC CRYSTAL TOPOGRAPHIC CAMERA [J].

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BURDETTE, HE ;

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GREEN, RE .

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[5]

BOETTINGER WJ, 1977, ADV XRAY ANAL, V20, P207

[6] EVIDENCE FOR INFLUENCE OF WORK-HARDENING ON MICROHARDNESS ANISOTROPY [J].

CALDER, RW ;

ARMSTRONG, RW .

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[7]

Conrad, 1973, SCI HARDNESS TESTING, P174

[8]

DANIELS FW, 1949, T AM SOC METAL, V41, P419

[9]

Kuhlmann-Wilsdorf D., 1968, WORK HARDENING, P97

[10] IMMOBILE DISLOCATION ARRANGEMENT IN ARSENIC-GROWN COPPER SINGLE-CRYSTALS OBSERVED BY X-RAY TOPOGRAPHY [J].

KURIYAMA, M ;

EARLY, JG ;

BURDETTE, HE .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1974, 7 (DEC1) :535-540

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