LOW TEMPERATURE OPTICAL-EPR SAMPLE PROBE USING TUNABLE COAXIAL COUPLING

被引：4

作者：

ENSIGN, TC

CHANG, TT

机构：

[1] National Bureau of Standards, Washington

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1969年 / 40卷 / 02期

关键词：

D O I：

10.1063/1.1683917

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An optical-EPR sample probe using tunable coaxial coupling, for use at fixed temperatures in the range 1-300 K, has been designed and constructed. It allows both critical coupling of the resonant cavity to the microwave system and good sample illumination, while minimizing thermal agitation. © 1969 The American Institute of Physics.

引用

页码：268 / &