NMR CONFIRMATION OF STRAINED DEFECTS IN AMORPHOUS SILICA

被引：219

作者：

BRINKER, CJ ^{[1
]}

KIRKPATRICK, RJ ^{[1
]}

TALLANT, DR ^{[1
]}

BUNKER, BC ^{[1
]}

MONTEZ, B ^{[1
]}

机构：

[1] UNIV ILLINOIS,DEPT GEOL,URBANA,IL 61801

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1988年 / 99卷 / 2-3期

关键词：

GELS - NUCLEAR MAGNETIC RESONANCE - SPECTROSCOPY; RAMAN; -; Applications;

D O I：

10.1016/0022-3093(88)90448-6

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Solid state **2**9Si magic angle sample spinning nuclear magnetic resonance spectroscopy and Raman spectroscopy were used to investigate the local silicon environment and siloxane ring vibrations in amorphous silica gels. Our results unambiguously relate the 608 cm** minus **1 Raman 'defect' in a-SiO//2 with reduced Si-O-Si bond angles indicative of strained 3-membered rings of silicate tetrahedra.

引用

页码：418 / 428

页数：11

共 32 条

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