ANOMALOUS REGIMES FOR GAAS ETCHING IN CL2-AR PLASMAS

被引:7
作者
DAGOSTINO, R [1 ]
CRAMAROSSA, F [1 ]
FRACASSI, F [1 ]
ILLUZZI, F [1 ]
ARMENISE, MN [1 ]
机构
[1] UNIV BARI,DIPARTIMENTO ELETTROTECN & ELETTRON,I-70125 BARI,ITALY
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1988年 / 6卷 / 05期
关键词
D O I
10.1116/1.584187
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1584 / 1591
页数:8
相关论文
共 21 条
[1]   DAMAGE AND CONTAMINATION-FREE GAAS AND ALGAAS ETCHING USING A NOVEL ULTRAHIGH-VACUUM REACTIVE ION-BEAM ETCHING SYSTEM WITH ETCHED SURFACE MONITORING AND CLEANING METHOD [J].
ASAKAWA, K ;
SUGATA, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03) :677-680
[2]  
BAKER RA, 1982, APPL PHYS LETT, V40, P583
[3]   ETCHING OF GALLIUM-ARSENIDE AND INDIUM-PHOSPHIDE IN RF DISCHARGES THROUGH MIXTURES OF TRICHLOROFLUOROMETHANE AND OXYGEN [J].
BURTON, RH ;
HOLLIEN, CL ;
MARCHUT, L ;
ABYS, SM ;
SMOLINSKY, G ;
GOTTSCHO, RA .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (11) :6663-6671
[4]  
BURTON RH, 1984, DRY ETCHING MICROELE, P81
[5]  
d'Agostino R., 1984, Plasma Chemistry and Plasma Processing, V4, P165, DOI 10.1007/BF00566839
[6]   ON THE USE OF ACTINOMETRIC EMISSION-SPECTROSCOPY IN SF6-O2 RADIOFREQUENCY DISCHARGES - THEORETICAL AND EXPERIMENTAL-ANALYSIS [J].
DAGOSTINO, R ;
CRAMAROSSA, F ;
DEBENEDICTIS, S ;
FRACASSI, F ;
LASKA, L ;
MASEK, K .
PLASMA CHEMISTRY AND PLASMA PROCESSING, 1985, 5 (03) :239-253
[7]  
Desimoni E., 1986, Computer Enhanced Spectroscopy, V3, P107
[8]   TEMPERATURE-DEPENDENCE OF INP AND GAAS ETCHING IN A CHLORINE PLASMA [J].
DONNELLY, VM ;
FLAMM, DL ;
TU, CW ;
IBBOTSON, DE .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (11) :2533-2537
[9]   CARBON-TETRACHLORIDE PLASMA-ETCHING OF GAAS AND INP - A KINETIC-STUDY UTILIZING NONPERTURBATIVE OPTICAL TECHNIQUES [J].
GOTTSCHO, RA ;
SMOLINSKY, G ;
BURTON, RH .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (08) :5908-5919
[10]   REACTIVE ION ETCHING OF GAAS IN A CHLORINE PLASMA [J].
HU, EL ;
HOWARD, RE .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1984, 2 (01) :85-88