CORRECTION OF SYSTEMATIC ERRORS IN DETERMINATION OF X-RAY DIFFRACTION INTENSITIES BY INTEGRATING MICRODENSITOMETERS

被引：8

作者：

WERNER, PE

机构：

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1971年 / 4卷 / 05期

关键词：

D O I：

10.1088/0022-3735/4/5/004

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：351 / &

共 13 条

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