DETERMINATION OF THICKNESS AND DIELECTRIC-CONSTANT OF THIN TRANSPARENT DIELECTRIC LAYERS USING SURFACE-PLASMON RESONANCE

被引：128

作者：

DEBRUIJN, HE

ALTENBURG, BSF

KOOYMAN, RPH

GREVE, J

机构：

[1] Biophysical Technology Group, Faculty of Applied Physics, University of Twente, 7500 AE Enschede

来源：

OPTICS COMMUNICATIONS | 1991年 / 82卷 / 5-6期

关键词：

D O I：

10.1016/0030-4018(91)90353-F

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The determination of the thickness and dielectric constant of thin dielectric layers by means of surface plasmon resonance is discussed. It appears to be impossible to determine these parameters from one surface plasmon response experiment. This is illustrated theoretically. Variation of the refractive index of the solution in which surface plasmon experiments were performed allowed us to determine these parameters separately.

引用

页码：425 / 432

页数：8

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