CORRECTION FACTORS FOR ELECTRON PROBE MICROANALYSIS OF SILICATES, OXIDES, CARBONATES, PHOSPHATES, AND SULFATES

被引：831

作者：

ALBEE, AL

RAY, L

机构：

来源：

关键词：

D O I：

10.1021/ac60294a030

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1408 / &

共 10 条

[1] [Anonymous], ELECT MICROPROBE
[2] EMPIRICAL CORRECTION FACTORS FOR ELECTRON MICROANALYSIS OF SILICATES AND OXIDES
BENCE, AE
ALBEE, AL
[J]. JOURNAL OF GEOLOGY, 1968, 76 (04) : 382 - &
[3] COLBY JW, 1968, ADVANCES XRAY ANALYS, V11, P287
[4] DUNCUMB P, 1968, 298 NAT BUR STAND SP, P133
[5] Duncumb P., 1966, ELECTRON MICROPROBE, P284
[6] GOLDSTEIN JI, X64269115 GODD SPAC
[7] X-RAY EMISSION MICROANALYSIS OF ROCK-FORMING MINERALS .7. GARNETS
KNOWLES, CR
SMITH, JV
BENCE, AE
ALBEE, AL
[J]. JOURNAL OF GEOLOGY, 1969, 77 (04) : 439 - &
[8] Philibert, 1963, XRAY OPTICS XRAY MIC, P379
[9] CHARACTERISTIC FLUORESCENCE CORRECTIONS IN ELECTRON-PROBE MICROANALYSIS
REED, SJB
[J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1965, 16 (07): : 913 - &
[10] QUANTITATIVE ELECTRON-PROBE MICROANALYSIS OF ROCK-FORMING MINERALS
SWEATMAN, TR
LONG, JVP
[J]. JOURNAL OF PETROLOGY, 1969, 10 (02) : 332 - +