A DECONVOLUTION PROCEDURE FOR PHOTOTHERMAL AND PHOTOCONDUCTIVE SPECTRA OF AMORPHOUS-SILICON FILMS

被引:12
作者
AMATO, G
GIORGIS, F
SPAGNOLO, R
机构
[1] Istituto Elettrotecnico Nazionale Galileo Ferraris, 91-10135 Turin, Strada delle Cacce
关键词
D O I
10.1063/1.350927
中图分类号
O59 [应用物理学];
学科分类号
摘要
A simple deconvolution procedure has been applied to photothermal and photoconductive spectra of a-Si:H films. The method requires no assumption about the midgap density of states, thus obtaining results in an unambiguous way. The analysis of the distortion occurring in photothermal spectra due to surface states is shown to be an effective way to separate between surface and bulk absorption, thus enabling a direct comparison between photothermal and photoconductive spectroscopies.
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收藏
页码:3479 / 3485
页数:7
相关论文
共 28 条
[1]  
AMATO G, 1990, MATER RES SOC SYMP P, V192, P207, DOI 10.1557/PROC-192-207
[2]   PHOTOTHERMAL AND PHOTOCONDUCTIVE MEASUREMENTS OF LOW-PRESSURE CHEMICALLY VAPOR-DEPOSITED AMORPHOUS-SILICON [J].
AMATO, G ;
BENEDETTO, G ;
FIZZOTTI, F ;
MANFREDOTTI, C ;
SPAGNOLO, R .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1990, 119 (01) :169-176
[3]   ELIMINATION OF INTERFERENCE-FRINGES FROM THIN-FILM PHOTOTHERMAL SPECTRA [J].
AMATO, G ;
BENEDETTO, G ;
SPAGNOLO, R .
MATERIALS LETTERS, 1990, 9 (04) :173-176
[4]   PHOTOTHERMAL DETECTION OF SURFACE-STATES IN AMORPHOUS-SILICON FILMS [J].
AMATO, G ;
BENEDETTO, G ;
BOARINO, L ;
SPAGNOLO, R .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1990, 50 (05) :503-507
[5]   SURFACE AND BULK-DENSITY OF STATES ANALYSIS IN A-SI-H BY A NEW INTERPRETATION OF PDS AND CPM MEASUREMENTS [J].
AMATO, G ;
BENEDETTO, G ;
BOARINO, L ;
SPAGNOLO, R .
SOLID STATE COMMUNICATIONS, 1991, 77 (03) :177-180
[6]  
AMATO G, IN PRESS
[7]  
AMATO G, 1991, 10TH P INT PHOT SOL
[8]  
AMER N, 1984, SEMICONDUCTORS SEM B, V21
[9]  
BENNETT MS, 1987, MATER RES SOC S P, V95, P577
[10]  
CURTIS H, 1989, ADV DISORDERED SEMIC, V1