NEUTRON-ACTIVATION ANALYSIS OF SEMICONDUCTOR SILICON

被引：35

作者：

NIESE, S ^{[1
]}

机构：

[1] AKAD WISSENSCH DDR,ZENT INST KERNFORSCH,DDR-8051 DRESDEN,GER DEM REP

来源：

JOURNAL OF RADIOANALYTICAL CHEMISTRY | 1977年 / 38卷 / 1-2期

关键词：

D O I：

10.1007/BF02520181

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：37 / 41

页数：5

共 8 条

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GORNER, W
LOOS, G
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[4] MULTIPLE-BETA-SINGLE-GAMMA DETECTOR ASSEMBLY FOR LOW-LEVEL COINCIDENCE SPECTROSCOPY
NIESE, S
GORNER, W
KLEEBERG, H
[J]. NUCLEAR INSTRUMENTS & METHODS, 1974, 118 (01): : 217 - 220
[5] BETA-GAMMA-COINCIDENCE SPECTROSCOPY OF RADIOCHEMICAL SEPARATED NUCLIDES IN HIGH-SENSITIVITY NEUTRON-ACTIVATION ANALYSIS
NIESE, S
[J]. JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1973, 15 (02): : 567 - 574
[6] NIESE S, 1964, KERNENERGIE, V7, P105
[7] NIESE S, 1975, ISOTOPENPRAXIS, V11, P125
[8] RUZICKA J, 1964, ATOM ENERGY REV, V2, P3