DIFFERENTIAL SCANNING TUNNELLING MICROSCOPY

被引：10

作者：

ABRAHAM, DW ^{[1
]}

WILLIAMS, CC ^{[1
]}

WICKRAMASINGHE, HK ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,DIV RES,YORKTOWN HTS,NY 10598

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1988年 / 152卷

关键词：

D O I：

10.1111/j.1365-2818.1988.tb01426.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：599 / 603

页数：5

共 12 条

[1] DIRECT IMAGING OF AU AN AG CLUSTERS BY SCANNING TUNNELING MICROSCOPY
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CLARKE, J
[J]. APPLIED PHYSICS LETTERS, 1986, 49 (14) : 853 - 855
[2] IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE
BRYANT, A
SMITH, DPE
QUATE, CF
[J]. APPLIED PHYSICS LETTERS, 1986, 48 (13) : 832 - 834
[3] Hamann D. R., 2001, PHYS REV LETT, V1988
[4] Koch R. H., 1987, 1987 International Electron Devices Meeting, IEDM. Technical Digeset (Cat. No.87CH2515-5), P566, DOI 10.1109/IEDM.1987.191489
[5] CONTAMINATION-MEDIATED DEFORMATION OF GRAPHITE BY THE SCANNING TUNNELING MICROSCOPE
MAMIN, HJ
GANZ, E
ABRAHAM, DW
THOMSON, RE
CLARKE, J
[J]. PHYSICAL REVIEW B, 1986, 34 (12): : 9015 - 9018
[6] ATOMIC FORCE MICROSCOPE FORCE MAPPING AND PROFILING ON A SUB 100-A SCALE
MARTIN, Y
WILLIAMS, CC
WICKRAMASINGHE, HK
[J]. JOURNAL OF APPLIED PHYSICS, 1987, 61 (10) : 4723 - 4729
[7] MCCORD MA, 1987, THESIS STANFORD U
[8] INTERATOMIC FORCES IN SCANNING TUNNELING MICROSCOPY - GIANT CORRUGATIONS OF THE GRAPHITE SURFACE - COMMENT
PETHICA, JB
[J]. PHYSICAL REVIEW LETTERS, 1986, 57 (25) : 3235 - 3235
[9] SCANNING DIFFERENTIAL PHASE-CONTRAST OPTICAL MICROSCOPE - APPLICATION TO SURFACE STUDIES
SEE, CW
IRAVANI, MV
WICKRAMASINGHE, HK
[J]. APPLIED OPTICS, 1985, 24 (15): : 2373 - 2379
[10] Stoll E., 1986, Proceedings of the SPIE - The International Society for Optical Engineering, V599, P442, DOI 10.1117/12.952414