QUANTITATIVE PIXE MICROANALYSIS OF GEOLOGICAL MATERIAL USING THE CSIRO PROTON MICROPROBE

被引：309

作者：

RYAN, CG ^{[1
]}

COUSENS, DR ^{[1
]}

SIE, SH ^{[1
]}

GRIFFIN, WL ^{[1
]}

SUTER, GF ^{[1
]}

CLAYTON, E ^{[1
]}

机构：

[1] ANSTO,DIV APPL PHYS,MENAI,NSW 2234,AUSTRALIA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 47卷 / 01期

关键词：

D O I：

10.1016/0168-583X(90)90047-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The proton microprobe opens up new areas of geoscience research, that demand an efficient quantitative PIXE analysis method for trace element levels down to the limits of detection. The method developed at the HIAF laboratory reliably treats statistical fluctuations to provide quantitative PIXE microanalysis down to these levels. The software package (GEO-PIXE) that supports this standardless analysis procedure includes secondary X-ray fluorescence, and is structured to process the large numbers of analyses required in many geoscience applications. Analyses of standard rocks demonstrate the accuracy of the method, and highlight the problems associated with the use of standards in trace element analysis. © 1990.

引用

页码：55 / 71

页数：17

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