USE OF FRUSTRATED TOTAL INTERNAL REFLECTION TO MEASURE FILM THICKNESS AND SURFACE RELIEFS

被引：13

作者：

HARRICK, NJ

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1962年 / 33卷 / 09期

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D O I：

10.1063/1.1702547

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：2774 / &

相关论文

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HARRICK, NJ
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[2] STUDY OF PHYSICS AND CHEMISTRY OF SURFACES FROM FRUSTRATED TOTAL INTERNAL REFLECTIONS
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[J]. PHYSICAL REVIEW LETTERS, 1960, 4 (05) : 224 - 226
[3] Schaefer C, 1910, ANN PHYS-BERLIN, V32, P648
[4] SHARPE LH, 1961, P CHEM SOC LONDON, P461
[5] WOOD RW, 1943, PHYSICAL OPTICS