EXAMINATION OF ANGULAR CORRELATION OF ANNIHILATION RADIATION IN SILICON SINGLE-CRYSTAL

被引：35

作者：

FUJIWARA, K ^{[1
]}

HYODO, T ^{[1
]}

机构：

[1] UNIV TOKYO,COLL GEN EDUC,INST PHYS,KOMABA,MEGURO,TOKYO,JAPAN

来源：

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1973年 / 35卷 / 04期

关键词：

D O I：

10.1143/JPSJ.35.1133

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1133 / 1135

页数：3

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