POINT CONTACT MOM TUNNELING DETECTOR ANALYSIS

[1] Dees JW, 1966, MICROWAVE J, V9, P48

[2] ELECTROLYTIC POINTING FINE WIRES [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1964, MT12 (03) : 360 - &

[3] ABSOLUTE FREQUENCY MEASUREMENTS OF CO2 CW LASER AT 28 THZ (10.6MUM) [J]. APPLIED PHYSICS LETTERS, 1970, 16 (06) : 251 - &

[4] GREEN SI, 1970, PIB S SUBMM WAVES

[5] ELECTRON BEAM SCANNING TECHNIQUE FOR MEASURING SURFACE WORK FUNCTION VARIATIONS [J]. SURFACE SCIENCE, 1966, 4 (01) : 64 - &

[6] TUNNELING OF A WAVE PACKET [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (12) : 3427 - &

[7] FREQUENCY MIXING IN INFRARED AND FAR-INFRARED USING A METAL-TO-METAL POINT CONTACT DIODE [J]. APPLIED PHYSICS LETTERS, 1968, 12 (12) : 401 - &

[8] POLLACK SR, 1965, T METALL SOC AIME, V233, P497

[9] SIMMONS JG, 1965, T METALL SOC AIME, V233, P485

[10] SIMMONS JG, 1963, J APPL PHYS, V34, P2851

[1] Dees JW, 1966, MICROWAVE J, V9, P48

[2] ELECTROLYTIC POINTING FINE WIRES [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1964, MT12 (03) : 360 - &

[3] ABSOLUTE FREQUENCY MEASUREMENTS OF CO2 CW LASER AT 28 THZ (10.6MUM) [J]. APPLIED PHYSICS LETTERS, 1970, 16 (06) : 251 - &

[4] GREEN SI, 1970, PIB S SUBMM WAVES

[5] ELECTRON BEAM SCANNING TECHNIQUE FOR MEASURING SURFACE WORK FUNCTION VARIATIONS [J]. SURFACE SCIENCE, 1966, 4 (01) : 64 - &

[6] TUNNELING OF A WAVE PACKET [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (12) : 3427 - &

[7] FREQUENCY MIXING IN INFRARED AND FAR-INFRARED USING A METAL-TO-METAL POINT CONTACT DIODE [J]. APPLIED PHYSICS LETTERS, 1968, 12 (12) : 401 - &

[8] POLLACK SR, 1965, T METALL SOC AIME, V233, P497

[9] SIMMONS JG, 1965, T METALL SOC AIME, V233, P485

[10] SIMMONS JG, 1963, J APPL PHYS, V34, P2851