SELECTED AREA CHANNELLING PATTERNS IN SCANNING ELECTRON MICROSCOPE

被引:32
作者
VANESSEN, CG
SCHULSON, EM
机构
[1] Department of Metallurgy, University of Oxford
关键词
D O I
10.1007/BF00550403
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A technique is presented and illustrated for generating orientation dependent electron channelling patterns in the scanning electron microscope from small selected areas on the surface of bulk specimens. Methods of reducing the pattern area to 1 to 2 μm in diameter are discussed. Numerous applications not previously possible are listed. © 1969 Chapman and Hall.
引用
收藏
页码:336 / &
相关论文
共 7 条
[1]   SOME COMMENTS ON INTERPRETATION OF KIKUCHI-LIKE REFLECTION PATTERNS OBSERVED BY SCANNING ELEECTRON MICROSCOPY [J].
BOOKER, GR ;
SHAW, AMB ;
WHELAN, MJ ;
HIRSCH, PB .
PHILOSOPHICAL MAGAZINE, 1967, 16 (144) :1185-&
[2]   ELECTRON GUN USING LONG-LIFE LANTHANUM HEXABORIDE CATHODE [J].
BROERS, AN .
JOURNAL OF APPLIED PHYSICS, 1967, 38 (04) :1991-&
[3]   CORRECTION [J].
BROERS, AN .
JOURNAL OF APPLIED PHYSICS, 1967, 38 (07) :3040-&
[4]   KIKUCHI-LIKE REFLECTION PATTERNS OBTAINED WITH SCANNING ELECTRON MICROSCOPE [J].
COATES, DG .
PHILOSOPHICAL MAGAZINE, 1967, 16 (144) :1179-&
[5]   DEFLECTION-MODULATION CRT DISPLAY [J].
EVERHART, TE .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (10) :1480-&
[6]  
SCHULSON EM, 1969, J SCI INSTR 2, V2
[7]  
SHAW AMB, 1969, J SCI INSTR 2, V2