TOTAL INTERNAL-REFLECTION RAMAN-SPECTROSCOPY AT THE CRITICAL ANGLE FOR RAMAN MEASUREMENTS OF THIN-FILMS

被引：28

作者：

IWAMOTO, R

OHTA, K

MIYA, M

MIMA, S

机构：

来源：

APPLIED SPECTROSCOPY | 1981年 / 35卷 / 06期

关键词：

Compendex;

D O I：

10.1366/0003702814732102

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

SPECTROSCOPIC ANALYSIS

引用

页码：584 / 587

页数：4

共 13 条

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