PLANNING FOR COMPLETE SENSOR COVERAGE IN INSPECTION

被引：122

作者：

TARBOX, GH ^{[1
]}

GOTTSCHLICH, SN ^{[1
]}

机构：

[1] RENSSELAER POLYTECH INST, DEPT ELECTR COMP & SYST ENGN, TROY, NY 12180 USA

来源：

COMPUTER VISION AND IMAGE UNDERSTANDING | 1995年 / 61卷 / 01期

关键词：

D O I：

10.1006/cviu.1995.1007

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

General purpose CAD-based inspection of manufactured objects often involves comparing a model created using intensity or range images of the actual object to a tolerance reference model of the ideal object. Before this comparison is made, a sufficiently complete geometric model of the workpiece must be synthesized from sensor data. In this paper we present planning algorithms for finding a set of sensing operations for completely measuring the exposed surface of an object to be inspected. While these planning algorithms were developed as part of a particular inspection system, the algorithms are applicable to other inspection systems and other applications than inspection. (C) 1995 Academic Press, Inc.

引用

页码：84 / 111

页数：28

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