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DIRECT SPECTROSCOPY OF ELECTRON AND HOLE SCATTERING
被引:71
作者
:
BELL, LD
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MOTOR CO,SCI RES STAFF,DEARBORN,MI 48121
FORD MOTOR CO,SCI RES STAFF,DEARBORN,MI 48121
BELL, LD
[
1
]
HECHT, MH
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MOTOR CO,SCI RES STAFF,DEARBORN,MI 48121
FORD MOTOR CO,SCI RES STAFF,DEARBORN,MI 48121
HECHT, MH
[
1
]
KAISER, WJ
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MOTOR CO,SCI RES STAFF,DEARBORN,MI 48121
FORD MOTOR CO,SCI RES STAFF,DEARBORN,MI 48121
KAISER, WJ
[
1
]
DAVIS, LC
论文数:
0
引用数:
0
h-index:
0
机构:
FORD MOTOR CO,SCI RES STAFF,DEARBORN,MI 48121
FORD MOTOR CO,SCI RES STAFF,DEARBORN,MI 48121
DAVIS, LC
[
1
]
机构
:
[1]
FORD MOTOR CO,SCI RES STAFF,DEARBORN,MI 48121
来源
:
PHYSICAL REVIEW LETTERS
|
1990年
/ 64卷
/ 22期
关键词
:
D O I
:
10.1103/PhysRevLett.64.2679
中图分类号
:
O4 [物理学];
学科分类号
:
0702 ;
摘要
:
A new spectroscopy has been developed for the first direct probe of carrier-carrier scattering in materials. This spectroscopy provides spatial and energy resolution of the scattering process and has been used to investigate transport, scattering phenomena, and hot-carrier creation in two important metal-semiconductor systems. A theoretical treatment of this scattering spectroscopy yields excellent agreement with experimental spectra and provides direct evidence that carrier-carrier scattering is a dominant energy-loss mechanism in hot-carrier transport. © 1990 The American Physical Society.
引用
收藏
页码:2679 / 2682
页数:4
相关论文
共 11 条
[1]
OBSERVATION OF INTERFACE BAND-STRUCTURE BY BALLISTIC-ELECTRON-EMISSION MICROSCOPY
BELL, LD
论文数:
0
引用数:
0
h-index:
0
BELL, LD
KAISER, WJ
论文数:
0
引用数:
0
h-index:
0
KAISER, WJ
[J].
PHYSICAL REVIEW LETTERS,
1988,
61
(20)
: 2368
-
2371
[2]
SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY
BINNING, G
论文数:
0
引用数:
0
h-index:
0
BINNING, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
GERBER, C
论文数:
0
引用数:
0
h-index:
0
GERBER, C
WEIBEL, E
论文数:
0
引用数:
0
h-index:
0
WEIBEL, E
[J].
PHYSICAL REVIEW LETTERS,
1982,
49
(01)
: 57
-
61
[3]
RANGE OF PHOTOEXCITED HOLES IN AU
CROWELL, CR
论文数:
0
引用数:
0
h-index:
0
CROWELL, CR
SPITZER, WG
论文数:
0
引用数:
0
h-index:
0
SPITZER, WG
WHITE, HG
论文数:
0
引用数:
0
h-index:
0
WHITE, HG
[J].
APPLIED PHYSICS LETTERS,
1962,
1
(01)
: 3
-
5
[4]
HOT-ELECTRON SPECTROSCOPY OF GAAS
HAYES, JR
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,MURRAY HILL,NJ 07974
AT&T BELL LABS,MURRAY HILL,NJ 07974
HAYES, JR
LEVI, AFJ
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,MURRAY HILL,NJ 07974
AT&T BELL LABS,MURRAY HILL,NJ 07974
LEVI, AFJ
WIEGMANN, W
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,MURRAY HILL,NJ 07974
AT&T BELL LABS,MURRAY HILL,NJ 07974
WIEGMANN, W
[J].
PHYSICAL REVIEW LETTERS,
1985,
54
(14)
: 1570
-
1572
[5]
HECHT MH, IN PRESS
[6]
DIRECT OBSERVATION OF BALLISTIC TRANSPORT IN GAAS
HEIBLUM, M
论文数:
0
引用数:
0
h-index:
0
HEIBLUM, M
NATHAN, MI
论文数:
0
引用数:
0
h-index:
0
NATHAN, MI
THOMAS, DC
论文数:
0
引用数:
0
h-index:
0
THOMAS, DC
KNOEDLER, CM
论文数:
0
引用数:
0
h-index:
0
KNOEDLER, CM
[J].
PHYSICAL REVIEW LETTERS,
1985,
55
(20)
: 2200
-
2203
[7]
OBSERVATION OF BALLISTIC HOLES
HEIBLUM, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
HEIBLUM, M
SEO, K
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
SEO, K
MEIER, HP
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
MEIER, HP
HICKMOTT, TW
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
HICKMOTT, TW
[J].
PHYSICAL REVIEW LETTERS,
1988,
60
(09)
: 828
-
831
[8]
DIRECT INVESTIGATION OF SUBSURFACE INTERFACE ELECTRONIC-STRUCTURE BY BALLISTIC-ELECTRON-EMISSION MICROSCOPY
KAISER, WJ
论文数:
0
引用数:
0
h-index:
0
KAISER, WJ
BELL, LD
论文数:
0
引用数:
0
h-index:
0
BELL, LD
[J].
PHYSICAL REVIEW LETTERS,
1988,
60
(14)
: 1406
-
1409
[9]
Seah M. P., 1979, Surface and Interface Analysis, V1, P2, DOI 10.1002/sia.740010103
[10]
GENERALIZED FORMULA FOR ELECTRIC TUNNEL EFFECT BETWEEN SIMILAR ELECTRODES SEPARATED BY A THIN INSULATING FILM
SIMMONS, JG
论文数:
0
引用数:
0
h-index:
0
SIMMONS, JG
[J].
JOURNAL OF APPLIED PHYSICS,
1963,
34
(06)
: 1793
-
&
←
1
2
→
共 11 条
[1]
OBSERVATION OF INTERFACE BAND-STRUCTURE BY BALLISTIC-ELECTRON-EMISSION MICROSCOPY
BELL, LD
论文数:
0
引用数:
0
h-index:
0
BELL, LD
KAISER, WJ
论文数:
0
引用数:
0
h-index:
0
KAISER, WJ
[J].
PHYSICAL REVIEW LETTERS,
1988,
61
(20)
: 2368
-
2371
[2]
SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY
BINNING, G
论文数:
0
引用数:
0
h-index:
0
BINNING, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
GERBER, C
论文数:
0
引用数:
0
h-index:
0
GERBER, C
WEIBEL, E
论文数:
0
引用数:
0
h-index:
0
WEIBEL, E
[J].
PHYSICAL REVIEW LETTERS,
1982,
49
(01)
: 57
-
61
[3]
RANGE OF PHOTOEXCITED HOLES IN AU
CROWELL, CR
论文数:
0
引用数:
0
h-index:
0
CROWELL, CR
SPITZER, WG
论文数:
0
引用数:
0
h-index:
0
SPITZER, WG
WHITE, HG
论文数:
0
引用数:
0
h-index:
0
WHITE, HG
[J].
APPLIED PHYSICS LETTERS,
1962,
1
(01)
: 3
-
5
[4]
HOT-ELECTRON SPECTROSCOPY OF GAAS
HAYES, JR
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,MURRAY HILL,NJ 07974
AT&T BELL LABS,MURRAY HILL,NJ 07974
HAYES, JR
LEVI, AFJ
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,MURRAY HILL,NJ 07974
AT&T BELL LABS,MURRAY HILL,NJ 07974
LEVI, AFJ
WIEGMANN, W
论文数:
0
引用数:
0
h-index:
0
机构:
AT&T BELL LABS,MURRAY HILL,NJ 07974
AT&T BELL LABS,MURRAY HILL,NJ 07974
WIEGMANN, W
[J].
PHYSICAL REVIEW LETTERS,
1985,
54
(14)
: 1570
-
1572
[5]
HECHT MH, IN PRESS
[6]
DIRECT OBSERVATION OF BALLISTIC TRANSPORT IN GAAS
HEIBLUM, M
论文数:
0
引用数:
0
h-index:
0
HEIBLUM, M
NATHAN, MI
论文数:
0
引用数:
0
h-index:
0
NATHAN, MI
THOMAS, DC
论文数:
0
引用数:
0
h-index:
0
THOMAS, DC
KNOEDLER, CM
论文数:
0
引用数:
0
h-index:
0
KNOEDLER, CM
[J].
PHYSICAL REVIEW LETTERS,
1985,
55
(20)
: 2200
-
2203
[7]
OBSERVATION OF BALLISTIC HOLES
HEIBLUM, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
HEIBLUM, M
SEO, K
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
SEO, K
MEIER, HP
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
MEIER, HP
HICKMOTT, TW
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
HICKMOTT, TW
[J].
PHYSICAL REVIEW LETTERS,
1988,
60
(09)
: 828
-
831
[8]
DIRECT INVESTIGATION OF SUBSURFACE INTERFACE ELECTRONIC-STRUCTURE BY BALLISTIC-ELECTRON-EMISSION MICROSCOPY
KAISER, WJ
论文数:
0
引用数:
0
h-index:
0
KAISER, WJ
BELL, LD
论文数:
0
引用数:
0
h-index:
0
BELL, LD
[J].
PHYSICAL REVIEW LETTERS,
1988,
60
(14)
: 1406
-
1409
[9]
Seah M. P., 1979, Surface and Interface Analysis, V1, P2, DOI 10.1002/sia.740010103
[10]
GENERALIZED FORMULA FOR ELECTRIC TUNNEL EFFECT BETWEEN SIMILAR ELECTRODES SEPARATED BY A THIN INSULATING FILM
SIMMONS, JG
论文数:
0
引用数:
0
h-index:
0
SIMMONS, JG
[J].
JOURNAL OF APPLIED PHYSICS,
1963,
34
(06)
: 1793
-
&
←
1
2
→