3-DIMENSIONAL RECONSTRUCTION OF ELECTRIC-POTENTIAL DISTRIBUTION IN ELECTRON-HOLOGRAPHIC INTERFEROMETRY

被引:32
作者
LAI, GM
HIRAYAMA, T
ISHIZUKA, K
TANJI, T
TONOMURA, A
机构
[1] Tonomura Electron Wavefront Project, Research Development Corporation of Japan, Faculty of Engineering, Toyo University, Kawagoe, Saitama
关键词
ELECTRON HOLOGRAPHY; 3-DIMENSIONAL RECONSTRUCTION; PHASE MEASUREMENT; ELECTRIC FIELDS;
D O I
10.1364/AO.33.000829
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A method of reconstructing the three-dimensional electric-potential distribution of a microscopic object with electron-holographic interferometry is presented. A sequence of processing techniques is developed to obtain the projected phase proportional to the potential distribution. A modified backprojection algorithm is used to reconstruct a three-dimensional potential distribution from the projected potentials obtained at different projection directions. In an experiment this method is applied to reconstruct three-dimensional latex particles.
引用
收藏
页码:829 / 833
页数:5
相关论文
共 11 条
[1]   ELECTRON GUN USING A FIELD EMISSION SOURCE [J].
CREWE, AV ;
EGGENBER.DN ;
WALL, J ;
WELTER, LM .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (04) :576-&
[2]   RECONSTRUCTION OF 3 DIMENSIONAL STRUCTURES FROM ELECTRON MICROGRAPHS [J].
DEROSIER, DJ ;
KLUG, A .
NATURE, 1968, 217 (5124) :130-&
[3]   ALGEBRAIC RECONSTRUCTION TECHNIQUES (ART) FOR 3-DIMENSIONAL ELECTRON MICROSCOPY AND X-RAY PHOTOGRAPHY [J].
GORDON, R ;
BENDER, R ;
HERMAN, GT .
JOURNAL OF THEORETICAL BIOLOGY, 1970, 29 (03) :471-&
[4]   PHASE-EXTRACTION TECHNIQUE FOR ELECTRON HOLOGRAPHY USING A GRATING OPTICAL-SYSTEM [J].
LAI, GM ;
CHEN, J ;
ISHIZUKA, K ;
TONOMURA, A .
APPLIED OPTICS, 1992, 31 (28) :5940-5946
[5]   BEOBACHTUNGEN UND MESSUNGEN AN BIPRISMA-INTERFERENZEN MIT ELEKTRONENWELLEN [J].
MOLLENSTEDT, G ;
DUKER, H .
ZEITSCHRIFT FUR PHYSIK, 1956, 145 (03) :377-397
[6]   3-DIMENSIONAL RECONSTRUCTION FROM RADIOGRAPHS AND ELECTRON MICROGRAPHS - APPLICATION OF CONVOLUTIONS INSTEAD OF FOURIER TRANSFORMS [J].
RAMACHANDRAN, GN ;
LAKSHMINARAYANAN, AV .
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 1971, 68 (09) :2236-+
[7]  
Spence, 1998, EXPT HIGH RESOLUTION
[8]   COMPUTER-BASED HIGHLY SENSITIVE ELECTRON-WAVE INTERFEROMETRY [J].
TAKEDA, M ;
RU, QS .
APPLIED OPTICS, 1985, 24 (18) :3068-3071
[9]  
TONOMURA A, 1979, J ELECTRON MICROSC, V28, P1
[10]   APPLICATIONS OF ELECTRON HOLOGRAPHY [J].
TONOMURA, A .
REVIEWS OF MODERN PHYSICS, 1987, 59 (03) :639-669