PHYSICAL AND ELECTRICAL CHARACTERIZATION OF CO-DEPOSITED ZNS-MN ELECTROLUMINESCENT THIN-FILM STRUCTURES

被引：74

作者：

HURD, JM

KING, CN

机构：

[1] Applied Research Group, Tektronix Laboratory, Beaverton, 97077, Oregon

来源：

JOURNAL OF ELECTRONIC MATERIALS | 1979年 / 8卷 / 06期

关键词：

electroluminescence; thin film; zinc sulfide;

D O I：

10.1007/BF02651190

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The role of the Mn concentration in controlling the properties of ZnS:Mn electroluminescent thin film devices is reported. It is found that the maximum brightness occurs at 1.3 ± 0.3 mole % Mn, but that significant hysteresis occurs only for Mn concentrations higher than the maximum brightness doping level. © 1979 AIME.

引用

页码：879 / 891

页数：13

共 16 条

[1] TIME RESOLVED SPECTROSCOPY OF ZNS=MN BY DYE-LASER TECHNIQUE [J].