A SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING FIELD-EMISSION MICROSCOPE

被引：18

作者：

EMCH, R ^{[1
]}

NIEDERMANN, P ^{[1
]}

DESCOUTS, P ^{[1
]}

FISCHER, O ^{[1
]}

机构：

[1] UNIV GENEVA,DEPT PHYS MAT CONDENSEE,CH-1211 GENEVA 4,SWITZERLAND

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575420

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：379 / 379

页数：1

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[1] AN EASILY OPERABLE SCANNING TUNNELING MICROSCOPE
BESOCKE, K
[J]. SURFACE SCIENCE, 1987, 181 (1-2) : 145 - 153
[2] SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE
GERBER, C
BINNIG, G
FUCHS, H
MARTI, O
ROHRER, H
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02) : 221 - 224
[3] SIMPLE PIEZOELECTRIC TRANSLATION DEVICE
NIEDERMANN, P
EMCH, R
DESCOUTS, P
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (02) : 368 - 369
[4] FIELD-EMISSION FROM BROAD-AREA NIOBIUM CATHODES - EFFECTS OF HIGH-TEMPERATURE TREATMENT
NIEDERMANN, P
SANKARRAMAN, N
NOER, RJ
FISCHER, O
[J]. JOURNAL OF APPLIED PHYSICS, 1986, 59 (03) : 892 - 901