FRACTAL CHARACTERIZATION BY FREQUENCY-ANALYSIS .2. A NEW METHOD

被引：45

作者：

AGUILAR, M

ANGUIANO, E

PANCORBO, M

机构：

[1] Instituto de Ciencia de Materiales, Sede B (CSIC), Universidad Autónoma de Madrid (C-III), Madrid

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1993年 / 172卷

关键词：

STM; TUNNELING MICROSCOPY; FRACTAL GENERATION; SCANNING TUNNELING; MICROSCOPE; FRACTAL; FRACTAL CHARACTERIZATION; FREQUENCY ANALYSIS;

D O I：

10.1111/j.1365-2818.1993.tb03417.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A new frequency analysis method, fractal analysis by circular average (FACA), and an image replication procedure are proposed that together produce accurate measurements of the fractal dimension of surfaces and profiles, eliminating Fourier transform artefacts which arise from the lack of periodic continuity in real surfaces and profiles.

引用

页码：233 / 238

页数：6