THE DETERMINATION OF DIELECTRIC LOSS TANGENT BY MICROWAVE PHASE TOMOGRAPHY

被引：6

作者：

AITMEHDI, R ^{[1
]}

ANDERSON, AP ^{[1
]}

SALI, S ^{[1
]}

FERRANDO, M ^{[1
]}

机构：

[1] UNIV POLITECN CATALUNA,DEPT ELECTROPHYS,E-08034 BARCELONA,SPAIN

来源：

关键词：

D O I：

10.1088/0266-5611/4/2/002

中图分类号：

O29 [应用数学];

学科分类号：

070104 ;

摘要：

引用

页码：333 / 345

页数：13

共 17 条

[1]

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ANDERSON, AP ;

MEHDI, RA .

[3]

ANDERSON AP, 1982, ACOUSTICAL IMAGING, V12

[4]

ERMERT H, 1986, NTZ ARCH, V8

[5]

Harrington R. F., 1968, FIELD COMPUTATION MO

[6]

KAVEH M, 1982, ACOUST IMAGING, V12, P599

[7]

Kerker M, 1969, SCATTERING LIGHT OTH

[8] RECONSTRUCTIVE TOMOGRAPHY AND APPLICATIONS TO ULTRASONICS [J].

MUELLER, RK ;

KAVEH, M ;

WADE, G .

[9]

PAN SX, 1985, IEEE T ASSP, V31, P1262

[10]

PAOLINI FJ, 1987, P IEE H, V134, P25