CHARACTERIZATION AND MODELING FOR STATISTICAL DESIGN

[1] ASHAR KG, 1963, IBM J, V1, P207

[2] BALABAN P, 1971, AT&T TECH J, V50, P1263

[3] CORRELATION OF DIFFUSION PROCESS VARIATIONS WITH VARIATIONS IN ELECTRICAL PARAMETERS OF BIPOLAR TRANSISTORS [J]. PROCEEDINGS OF THE IEEE, 1969, 57 (09) : 1513 - &

[4] SATURATION IN BIPOLAR TRANSISTORS [J]. ELECTRONICS LETTERS, 1970, 6 (06) : 167 - +

[5] CALAHAN DA, 1968, COMPUTER AIDED NETWO, pCH5

[6] CERMAK IA, 1971, AT&T TECH J, V50, P1173

[7] MEASURING FREQUENCY CHARACTERISTICS OF LINEAR 2-PORT NETWORKS AUTOMATICALLY [J]. BELL SYSTEM TECHNICAL JOURNAL, 1969, 48 (05): : 1313 - +

[8] GRAY PE, 1964, SEEC, V2, pCH10

[9] AN INTEGRAL CHARGE CONTROL MODEL OF BIPOLAR TRANSISTORS [J]. BELL SYSTEM TECHNICAL JOURNAL, 1970, 49 (05): : 827 - +

[10] GUMMEL HK, 1961, P IRE, V49, P834

[1] ASHAR KG, 1963, IBM J, V1, P207

[2] BALABAN P, 1971, AT&T TECH J, V50, P1263

[3] CORRELATION OF DIFFUSION PROCESS VARIATIONS WITH VARIATIONS IN ELECTRICAL PARAMETERS OF BIPOLAR TRANSISTORS [J]. PROCEEDINGS OF THE IEEE, 1969, 57 (09) : 1513 - &

[4] SATURATION IN BIPOLAR TRANSISTORS [J]. ELECTRONICS LETTERS, 1970, 6 (06) : 167 - +

[5] CALAHAN DA, 1968, COMPUTER AIDED NETWO, pCH5

[6] CERMAK IA, 1971, AT&T TECH J, V50, P1173

[7] MEASURING FREQUENCY CHARACTERISTICS OF LINEAR 2-PORT NETWORKS AUTOMATICALLY [J]. BELL SYSTEM TECHNICAL JOURNAL, 1969, 48 (05): : 1313 - +

[8] GRAY PE, 1964, SEEC, V2, pCH10

[9] AN INTEGRAL CHARGE CONTROL MODEL OF BIPOLAR TRANSISTORS [J]. BELL SYSTEM TECHNICAL JOURNAL, 1970, 49 (05): : 827 - +

[10] GUMMEL HK, 1961, P IRE, V49, P834