ALUMINUM ON SI(100) - GROWTH AND STRUCTURE OF THE 1ST LAYER

被引:20
作者
BROCKS, G
KELLY, PJ
CAR, R
机构
[1] IRRMA, CH-1015 LAUSANNE, SWITZERLAND
[2] UNIV GENEVA, DEPT CONDENSED MATTER PHYS, CH-1211 GENEVA, SWITZERLAND
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 04期
关键词
D O I
10.1116/1.587235
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The growth and the (electronic) structure of a single layer of aluminum on the Si(100) surface are examined by means of first principles calculations. The calculated local density of states is used to interprete scanning tunneling microscopy data. We identify the adsorption sites that give rise to the polymerization-like one-dimensional growth of Al. The Al-induced surface states of the p (2 x 2) covered Si(100) surface are calculated. The surface bandgap is increased, as compared to the clean Si(100) surface, which means that the first adsorbed Al layer passivates the surface electrically.
引用
收藏
页码:2705 / 2708
页数:4
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