THE AGING BEHAVIOR OF COMMERCIAL THICK-FILM RESISTORS

被引：18

作者：

SINNADURAI, N

WILSON, KJ

机构：

来源：

IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 1982年 / 5卷 / 03期

关键词：

D O I：

10.1109/TCHMT.1982.1135972

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：308 / 317

页数：10

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[5]

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[6]

HETHERINGTON G, 1965, PHYS CHEM GLASSES, V6, P6

[7]

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[8]

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[10]

LAWSON RW, 1974, P IEEE RELIABILITY P, V12, P243