ATOMIC-SCALE FRICTION AND WEAR OF MICA

被引:151
作者
HU, J
XIAO, XD
OGLETREE, DF
SALMERON, M
机构
[1] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,DIV MAT SCI,BERKELEY,CA 94720
[2] ACAD SINICA,SHANGHAI INST NUCL RES,SHANGHAI 201800,PEOPLES R CHINA
关键词
ATOMIC FORCE MICROSCOPY; MICA; SILICON NITRIDE; TRIBOLOGY; WATER;
D O I
10.1016/0039-6028(94)00846-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The frictional behavior of mica surfaces with silicon nitride tips has been investigated systematically with the AFM as a function of load, tip geometry, mica lattice orientation and humidity. Frictional forces are found to be proportional to loads between 10 and 80 nN. The friction coefficient is quite reproducible for different samples, tip radii, scanning speed and direction. At low loads, however, a non-linear behavior of the friction versus load is observed. At high (> 70%) relative humidity and in water, friction is reduced. Repeated scanning of mica surfaces shows layer-by-layer wear processes.
引用
收藏
页码:358 / 370
页数:13
相关论文
共 21 条
[1]  
[Anonymous], 2001, FRICTION LUBRICATION
[2]   INFLUENCE OF CAPILLARY CONDENSATION OF WATER ON NANOTRIBOLOGY STUDIED BY FORCE MICROSCOPY [J].
BINGGELI, M ;
MATE, CM .
APPLIED PHYSICS LETTERS, 1994, 65 (04) :415-417
[3]   A NONDESTRUCTIVE METHOD FOR DETERMINING THE SPRING CONSTANT OF CANTILEVERS FOR SCANNING FORCE MICROSCOPY [J].
CLEVELAND, JP ;
MANNE, S ;
BOCEK, D ;
HANSMA, PK .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (02) :403-405
[4]   ATOMIC SCALE FRICTION BETWEEN THE MUSCOVITE MICA CLEAVAGE PLANE AND A TUNGSTEN TIP [J].
ERLANDSSON, R ;
HADZIIOANNOU, G ;
MATE, CM ;
MCCLELLAND, GM ;
CHIANG, S .
JOURNAL OF CHEMICAL PHYSICS, 1988, 89 (08) :5190-5193
[5]  
GUNTHERODT HJ, IN PRESS NATO SERIES
[6]   ANISOTROPY OF FRICTIONAL FORCES IN MUSCOVITE MICA [J].
HIRANO, M ;
SHINJO, K ;
KANEKO, R ;
MURATA, Y .
PHYSICAL REVIEW LETTERS, 1991, 67 (19) :2642-2645
[7]  
HU J, IN PRESS
[8]   MEASUREMENT OF FORCES BETWEEN 2 MICA SURFACES IN AQUEOUS-ELECTROLYTE SOLUTIONS IN RANGE 0-100 NM [J].
ISRAELACHVILI, JN ;
ADAMS, GE .
JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS I, 1978, 74 :975-&
[9]   ATOMIC FORCE MICROSCOPY IMAGING OF T4 BACTERIOPHAGES ON SILICON SUBSTRATES [J].
KOLBE, WF ;
OGLETREE, DF ;
SALMERON, MB .
ULTRAMICROSCOPY, 1992, 42 :1113-1117
[10]   Combined scanning force and friction microscopy of mica [J].
Marti, O. ;
Colchero, J. ;
Mlynek, J. .
Nanotechnology, 1990, 1 (02) :141-144