A VERSATILE 3/4 CRYSTAL X-RAY DIFFRACTOMETER FOR X-RAY OPTICAL-ELEMENTS - PERFORMANCE AND APPLICATIONS

被引：9

作者：

CHRISTENSEN, FE

HORNSTRUP, A

JACOBSEN, E

JONASSON, P

MADSEN, MM

SCHNOPPER, HW

WESTERGAARD, NJ

ORUP, P

机构：

[1] Danish Space Research Inst, Lyngby, Den, Danish Space Research Inst, Lyngby, Den

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1987年 / 256卷 / 02期

关键词：

X-RAYS - Spectrum Analysis;

D O I：

10.1016/0168-9002(87)90237-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A versatile X-ray diffractometer for the study of X-ray optical elements such as grazing incidence mirrors, crystals and X-ray gratings has been built and put into operation at the Danish Space Research Institute. The diffractometer is built on a 1. 5 m long granite bench with the X-ray source located at one end of the bench where it can be rotated around a fixed vertical axis. The beam defining elements are perfect crystals of Si, Ge or quartz. With these it is possible to define a highly collimated beam of a few arcsec fwhm in the scattering plane. Examples of measurements on various X-ray optical elements are presented. The deconvolution of the experimental data is discussed in general terms and as an example the results of a calculation of the diffractometer resolution function for a four crystal setup are presented.

引用

页码：381 / 392

页数：12

共 11 条

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[2] BYRNAK BP, 1985, APPL OPTICS, V23, P2543
[3] CHRISTENSEN FE, 1981, THESIS RISO NATIONAL
[4] CHRISTENSEN FE, UNPUB J APPL OPTICS
[5] CHRISTENSEN FE, 1985, SPIE P, V597
[6] CHRISTENSEN FE, 1985, SPIE P, V563, P401
[7] CHURCH EL, 1981, SPIE P, V314, P202
[8] NOLL RJ, 1979, SPIE P, V184, P203
[9] THE RESOLUTION FUNCTION OF A PERFECT-CRYSTAL 3-AXIS X-RAY SPECTROMETER
PYNN, R
FUJII, Y
SHIRANE, G
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1983, 39 (JAN): : 38 - 46
[10] ZACHARIASSEN WH, 1985, XRAY DIFFRACTION CRY

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